Surface analysis by means of SEM/EDX
Our offer
- Surface condition/condition assessment in new condition and after use/reprocessing by means of scanning electron microscopy (SEM)
- Homogeneity and removal of coatings
- Material determination by energy dispersive X-ray spectroscopy (EDX)
- Damage analysis
- Recognition of markings and inscriptions (e.g. UDI - Unique Device Identification)
